
The Kennedy 50–75mm External Micrometer is engineered for reliable and accurate measurement in demanding environments. Manufactured to BS 870 standards, it features a robust enamelled frame and precision-ground tungsten carbide tipped anvils that ensure longevity and dependable performance over time.
This micrometer delivers consistent readings with 0.01mm graduations and is suitable for metric measurement applications within the 50mm to 75mm range. The precision ground measuring faces provide exceptional flatness of 0.6mm, while the parallelism and instrumental error are controlled within tight tolerances, enhancing measurement accuracy.
Additionally, this tool is supplied in a sturdy plastic case for secure storage and transport, making it ideal for workshop, laboratory, or field use where accuracy and protection are essential.
Measuring Range: 50 – 75 mm
Graduations: 0.01 mm
Frame Material: Enamelled
Anvil Type: Tungsten carbide tipped
Flatness: 0.6 mm
Parallelism: (2 + L/100) µm
Instrumental Error: ±(1 + L/75) µm
System of Measurement: Metric
Includes: Plastic case
Weight: 400 g
EAN: 5036140107298
UNSPSC Code: 41111601
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